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"Investigation of different screening methods on threshold voltage and gate ..."

Limeng Shi et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118276

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  - conf/irps/ShiZQJBWASL23
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Limeng Shi, Shengnan Zhu, Jiashu Qian, Michael Jin, Monikuntala Bhattacharya, Marvin H. White, Anant K. Agarwal, Atsushi Shimbori, Tianshi Liu:
Investigation of different screening methods on threshold voltage and gate oxide lifetime of SiC Power MOSFETs. IRPS 2023: 1-7

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