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"Wafer Level Approach for the Investigation of the Long-Term Stability of ..."
Timo Schossler et al. (2019)
- Timo Schossler, Florian Schon, Christian Lemier, Gerald Urban:
Wafer Level Approach for the Investigation of the Long-Term Stability of Resistive Platinum Devices at Elevated Temperatures. IRPS 2019: 1-5
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