"Surface Charge Migration in SiC Power MOSFETs Induced by ..."

B. D. Rummel et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529461

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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B. D. Rummel, C. E. Glaser, R. T. Gurule, M. Groves, A. T. Binder, R. Floyd, L. Yates, K. J. Reilly, R. J. Kaplar:
Surface Charge Migration in SiC Power MOSFETs Induced by HVDC-H³TRB Testing. IRPS 2024: 52

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