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"Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization ..."

Priyankka Gundlapudi Ravikumar et al. (2024)

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DOI: 10.1109/IRPS48228.2024.10529414

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-29

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  - conf/irps/RavikumarRASKDPATYIDMK24
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  - https://dblp.org/rec/conf/irps/RavikumarRASKDPATYIDMK24
Priyankka Gundlapudi Ravikumar, Prasanna Venkatesan Ravindran, Khandker Akif Aabrar, Taeyoung Song, Sharadindu Gopal Kirtania, Dipjyoti Das, Chinsung Park, Nashrah Afroze, Mengkun Tian, Shimeng Yu, Ahmad Ehtesham Islam, Suman Datta, Souvik Mahapatra, Asif Islam Khan:
Comprehensive Time Dependent Dielectric Breakdown (TDDB) Characterization of Ferroelectric Capacitors Under Bipolar Stress Conditions. IRPS 2024: 1-5

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