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"Effects of Collected Charge and Drain Area on SE Response of SRAMs at the ..."

Nicholas J. Pieper et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10118115

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-19

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  - conf/irps/PieperXBPB23
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Nicholas J. Pieper, Yoni Xiong, Dennis R. Ball, J. Pasternak, Bharat L. Bhuva:
Effects of Collected Charge and Drain Area on SE Response of SRAMs at the 5-nm FinFET Node. IRPS 2023: 1-6

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