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"Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory."
Nikolaos Papandreou et al. (2019)
- Nikolaos Papandreou, Haralampos Pozidis, Thomas P. Parnell, Nikolas Ioannou, Roman A. Pletka, Sasa Tomic, Patrick Breen, Gary A. Tressler, Aaron Fry, Timothy Fisher:
Characterization and Analysis of Bit Errors in 3D TLC NAND Flash Memory. IRPS 2019: 1-6
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