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"eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology."

James A. O'Donnell et al. (2019)

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DOI: 10.1109/IRPS.2019.8720520

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/ODonnellCPHAHBG19
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  persistent URL:
  - https://dblp.org/rec/conf/irps/ODonnellCPHAHBG19
James A. O'Donnell, Chris Connor, Tanmoy Pramanik, Jeff Hicks, Juan G. Alzate, Fatih Hamzaoglu, Justin Brockman, Oleg Golonzka, Kevin Fischer:
eNVM MRAM Retention Reliability Modeling in 22FFL FinFET Technology. IRPS 2019: 1-3

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