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"Modelling Degradation of Matched-Circuits in Operational Conditions: ..."

Khai Nguyen, Geoff Liang (2019)

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DOI: 10.1109/IRPS.2019.8720593

access: closed

type: Conference or Workshop Paper

metadata version: 2019-05-31

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  dblp key:
  - conf/irps/NguyenL19
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Khai Nguyen, Geoff Liang:
Modelling Degradation of Matched-Circuits in Operational Conditions: Active and Stand-by Modes. IRPS 2019: 1-5

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