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"Impact of Passive & Active Load Gate Impedance on Breakdown Hardness ..."

A. P. Nguyen et al. (2019)

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DOI: 10.1109/IRPS.2019.8720591

access: closed

type: Conference or Workshop Paper

metadata version: 2022-08-04

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  dblp key:
  - conf/irps/NguyenGRCRFG19
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  - https://dblp.org/rec/conf/irps/NguyenGRCRFG19
A. P. Nguyen, Xavier Garros, M. Rafik, Florian Cacho, David Roy, Xavier Federspiel, Fred Gaillard:
Impact of Passive & Active Load Gate Impedance on Breakdown Hardness in 28nm FDSOI Technology. IRPS 2019: 1-5

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