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"Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET."

Balaji Narasimham et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405216

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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Balaji Narasimham, Vikas Chaudhary, Mike Smith, Liming Tsau, Dennis R. Ball, Bharat L. Bhuva:
Scaling Trends in the Soft Error Rate of SRAMs from Planar to 5-nm FinFET. IRPS 2021: 1-5

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