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"Novel Electrical Detection Method for Random Defects on Peripheral ..."

Bu-Il Nam et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764437

access: closed

type: Conference or Workshop Paper

metadata version: 2023-02-13

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  dblp key:
  - conf/irps/NamCHDJPLJKKSSC22
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  persistent URL:
  - https://dblp.org/rec/conf/irps/NamCHDJPLJKKSSC22
Bu-Il Nam, Young-Ha Choi, Sungki Hong, Ki-Young Dong, Wontaeck Jung, Sang-Won Park, Soon-Yong Lee, Dooyeun Jung, Byoung-Hee Kim, Eun-Kyoung Kim, Ki-Whan Song, Jai Hyuk Song, Woo Young Choi:
Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory. IRPS 2022: 40-1

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