"Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap ..."

M. Monishmurali, Milova Paul, Mayank Shrivastava (2020)

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DOI: 10.1109/IRPS45951.2020.9129356

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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M. Monishmurali, Milova Paul, Mayank Shrivastava:
Improved Turn-on Uniformity & Failure Current Density by n-& p-Tap Engineering in Fin Based SCRs. IRPS 2020: 1-6

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