Stop the war!
Остановите войну!
for scientists:
default search action
"The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case ..."
Peter Moens et al. (2023)
- Peter Moens, F. Geenen, L. De Schepper, JF Cano, J. Lettens, S. Maslougkas, J. Franchi, Martin Domeij:
The Concept of Safe Operating Area for Gate Dielectrics: the SiC/SiO2 Case Study. IRPS 2023: 1-5
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.