"Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory ..."

Valentina Meli et al. (2023)

> Home

Details and statistics

DOI: 10.1109/IRPS48203.2023.10118339

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/MeliNRCMTBSC23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/MeliNRCMTBSC23
Valentina Meli, Gabriele Navarro, J. Rottner, Niccolo Castellani, S. Martin, N. P. Tran, Guillaume Bourgeois, C. Sabbione, Marie Claire Cyrille:
Multi Level Cell Reliability in Ge-rich GeSbTe-based Phase Change Memory Arrays. IRPS 2023: 1-5

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.