"Burst CV (< 2μs) Measurement System for BTI Analysis of MOS ..."

Himanshu Marothya et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10983414

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Himanshu Marothya, Atul Sachan, Vishwas Acharya, Sandip Mondal:
Burst CV (< 2μs) Measurement System for BTI Analysis of MOS Capacitors. IRPS 2025: 1-5

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