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"Correlated Effects of Radiation and Hot Carrier Degradation on the ..."

Bikram Kishore Mahajan et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764450

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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  dblp key:
  - conf/irps/MahajanCRRA22
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  - https://dblp.org/rec/conf/irps/MahajanCRRA22
Bikram Kishore Mahajan, Yen-Pu Chen, Ulisses Alberto Heredia Rivera, Rahim Rahimi, Muhammad Ashraful Alam:
Correlated Effects of Radiation and Hot Carrier Degradation on the Performance of LDMOS Transistors. IRPS 2022: 52-1

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