"AC stress reliability study of a new high voltage transistor for logic ..."

Jordan Locati et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128832

access: closed

type: Conference or Workshop Paper

metadata version: 2021-08-13

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Jordan Locati, Vincenzo Della Marca, Christian Rivero, Arnaud Régnier, Stephan Niel, Karine Coulié:
AC stress reliability study of a new high voltage transistor for logic memory circuits. IRPS 2020: 1-5

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