"Robust Off-State TDDB Reliability of n-LDMOS."

Wen Liu et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764573

access: closed

type: Conference or Workshop Paper

metadata version: 2022-05-09

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Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam:
Robust Off-State TDDB Reliability of n-LDMOS. IRPS 2022: 26-1

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