Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Reliability Improvement with Optimized BEOL Process in Advanced DRAM."

J. H. Lee et al. (2023)

> Home

Details and statistics

DOI: 10.1109/IRPS48203.2023.10118168

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/LeeWLLLLKP23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/LeeWLLLLKP23
J. H. Lee, B. W. Woo, Y. M. Lee, N. H. Lee, S. H. Lee, Y. S. Lee, H. S. Kim, S. Pae:
Reliability Improvement with Optimized BEOL Process in Advanced DRAM. IRPS 2023: 1-4

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.