"Well-Charging Damage to Capacitors Connected Between VDD and VSS in a ..."

Hsi-Yu Kuo et al. (2025)

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DOI: 10.1109/IRPS48204.2025.10982926

access: closed

type: Conference or Workshop Paper

metadata version: 2025-06-04

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Hsi-Yu Kuo, Yu-Lin Chu, Chien-Jen Wang, Steven Sze Hang Poon, Chun-Wei Yao, Hsuan Chu, Yi-Ching Chen, Yi-Lun Chen, Yu-Ti Su, Chia-Lin Hsu, Tsung-Yuan Chen, Te-Liang Li, Ray Huang, Kuo-Ji Chen, Ming-Hsiang Song, Kejun Xia, Ryan Lu:
Well-Charging Damage to Capacitors Connected Between VDD and VSS in a Single Power Domain. IRPS 2025: 52

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