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"Physical Insights into Phosphorene Transistor Degradation Under Exposure ..."

Jeevesh Kumar et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129123

access: closed

type: Conference or Workshop Paper

metadata version: 2022-11-07

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  dblp key:
  - conf/irps/KumarAYSNZKS20
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  - https://dblp.org/rec/conf/irps/KumarAYSNZKS20
Jeevesh Kumar, Ansh, Asha Yadav, Anant Singh, Andrew Naclerio, Dmitri N. Zakharov, Piran Kidambi, Mayank Shrivastava:
Physical Insights into Phosphorene Transistor Degradation Under Exposure to Atmospheric Conditions and Electrical Stress. IRPS 2020: 1-4

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