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"Design Insights to Address Low Current ESD Failure and Power Scalability ..."
Nagothu Karmel Kranthi et al. (2020)
- Nagothu Karmel Kranthi, Boeila Sampath Kumar, Akram A. Salman, Gianluca Boselli, Mayank Shrivastava:
Design Insights to Address Low Current ESD Failure and Power Scalability Issues in High Voltage LDMOS-SCR Devices. IRPS 2020: 1-5
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