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"Impact of RTN on stochastic BTI degradation in scaled metal gate/high-k ..."

A. Kerber (2015)

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DOI: 10.1109/IRPS.2015.7112704

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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A. Kerber:
Impact of RTN on stochastic BTI degradation in scaled metal gate/high-k CMOS technologies. IRPS 2015: 3

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