"Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm ..."

Thibault Kempf et al. (2018)

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DOI: 10.1109/IRPS.2018.8353642

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-19

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Thibault Kempf, Vincenzo Della Marca, L. Baron, F. Maugain, Francesco La Rosa, Stephan Niel, Arnaud Régnier, Jean-Michel Portal, Pascal Masson:
Threshold voltage bitmap analysis methodology: Application to a 512kB 40nm Flash memory test chip. IRPS 2018: 6

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