"Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and ..."

Tobias Kemmer et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128308

access: closed

type: Conference or Workshop Paper

metadata version: 2021-10-14

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Tobias Kemmer, Michael Dammann, Martina Baeumler, Vladimir Polyakov, Peter Brückner, Helmer Konstanzer, Rüdiger Quay, Oliver Ambacher:
Failure Analysis of 100 nm AlGaN/GaN HEMTs Stressed under On- and Off-State Stress. IRPS 2020: 1-6

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