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"Hot-carrier degradation in single-layer double-gated graphene field-effect ..."

Yury Illarionov et al. (2015)

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DOI: 10.1109/IRPS.2015.7112834

access: closed

type: Conference or Workshop Paper

metadata version: 2024-06-17

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  - conf/irps/IllarionovWSVOM15
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Yury Illarionov, Michael Waltl, Anderson D. Smith, Sam Vaziri, Mikael Östling, Thomas Mueller, Max Christian Lemme, Tibor Grasser:
Hot-carrier degradation in single-layer double-gated graphene field-effect transistors. IRPS 2015: 2

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