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"Comprehensive Quality and Reliability Management for Automotive Product."

M. H. Hsieh et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9128795

access: closed

type: Conference or Workshop Paper

metadata version: 2023-07-17

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  dblp key:
  - conf/irps/HsiehCCLL20
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  - https://dblp.org/rec/conf/irps/HsiehCCLL20
M. H. Hsieh, W. S. Chiang, Harry H. Chen, M. Z. Lin, M. J. Lin:
Comprehensive Quality and Reliability Management for Automotive Product. IRPS 2020: 1-5

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