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"NBTI and HCD aware behavioral models for reliability analysis of analog ..."

Nils Heidmann et al. (2015)

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DOI: 10.1109/IRPS.2015.7112779

access: closed

type: Conference or Workshop Paper

metadata version: 2017-06-15

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Nils Heidmann, Nico Hellwege, Steffen Paul, Dagmar Peters-Drolshagen:
NBTI and HCD aware behavioral models for reliability analysis of analog CMOS circuits. IRPS 2015: 1

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