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"Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and ..."

Joycelyn Hai et al. (2022)

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DOI: 10.1109/IRPS48227.2022.9764535

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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  dblp key:
  - conf/irps/HaiCDLAFKG22
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  - https://dblp.org/rec/conf/irps/HaiCDLAFKG22
Joycelyn Hai, Florian Cacho, A. Divay, Estelle Lauga-Larroze, Jean-Daniel Arnould, Jeremie Forest, Vincent Knopik, Xavier Garros:
Comprehensive Analysis of RF Hot-Carrier Reliability Sensitivity and Design Explorations for 28GHz Power Amplifier Applications. IRPS 2022: 4

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