"Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs ..."

Tidjani Garba-Seybou et al. (2023)

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DOI: 10.1109/IRPS48203.2023.10117725

access: closed

type: Conference or Workshop Paper

metadata version: 2023-05-24

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Tidjani Garba-Seybou, Xavier Federspiel, Frederic Monsieur, Mathieu Sicre, Florian Cacho, Joycelyn Hai, Alain Bravaix:
Location of Oxide Breakdown Events under Off-state TDDB in 28nm N-MOSFETs dedicated to RF applications. IRPS 2023: 1-8

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