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"A fast and test-proven methodology of assessing RTN/fluctuation on deeply ..."

Rui Gao et al. (2020)

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DOI: 10.1109/IRPS45951.2020.9129230

access: closed

type: Conference or Workshop Paper

metadata version: 2021-01-21

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  dblp key:
  - conf/irps/GaoMCWZLHCLHEJW20
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  persistent URL:
  - https://dblp.org/rec/conf/irps/GaoMCWZLHCLHEJW20
Rui Gao, Mehzabeen Mehedi, Haibao Chen, Xinsheng Wang, Jianfu Zhang, Xiaoling Lin, Zhiyuan He, Yiqiang Chen, Dengyun Lei, Yun Huang, Yunfei En, Zhigang Ji, Runsheng Wang:
A fast and test-proven methodology of assessing RTN/fluctuation on deeply scaled nano pMOSFETs. IRPS 2020: 1-5

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