"Hot-Electron Effects in GaN GITs and HD-GITs: A Comprehensive Analysis."

Eric E. Fabris et al. (2019)

Details and statistics

DOI: 10.1109/IRPS.2019.8720472

access: closed

type: Conference or Workshop Paper

metadata version: 2022-10-24

a service of  Schloss Dagstuhl - Leibniz Center for Informatics