"Failure Mechanism and Unified Endurance Model of Embedded MRAM Towards ..."

Y. H. Chen et al. (2025)

> Home

Details and statistics

DOI: 10.1109/IRPS48204.2025.10983785

access: closed

type: Conference or Workshop Paper

metadata version: 2025-07-30

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ChenCOCHLWWCWHC25
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ChenCOCHLWWCWHC25
Y. H. Chen, Yu-Sheng Chen, Yi Ching Ong, Y. L. Chu, Kuo-Feng Huang, Yuan-Jen Lee, C. Y. Wang, C. Y. Wu, W. H. Chuang, Allen Y. J. Wang, K. C. Huang, Harry Chuang:
Failure Mechanism and Unified Endurance Model of Embedded MRAM Towards Cache Application. IRPS 2025: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.