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"The physical mechanism investigation of off-state drain bias TDDB and its ..."

I. K. Chen et al. (2018)

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DOI: 10.1109/IRPS.2018.8353575

access: closed

type: Conference or Workshop Paper

metadata version: 2019-01-22

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  - conf/irps/ChenCMHLTLH18
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I. K. Chen, S. C. Chen, S. Mukhopadhyay, D. S. Huang, J. H. Lee, Y. S. Tsai, Ryan Lu, Jun He:
The physical mechanism investigation of off-state drain bias TDDB and its implication in advance HK/MG FinFETs. IRPS 2018: 4

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