BibTeX record conf/irps/ChakrabortySDM20

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@inproceedings{DBLP:conf/irps/ChakrabortySDM20,
  author    = {Wriddhi Chakraborty and
               Uma Sharma and
               Suman Datta and
               Souvik Mahapatra},
  title     = {Hot Carrier Degradation in Cryo-CMOS},
  booktitle = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
               Dallas, TX, USA, April 28 - May 30, 2020},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/IRPS45951.2020.9129312},
  doi       = {10.1109/IRPS45951.2020.9129312},
  timestamp = {Wed, 20 Jan 2021 09:07:40 +0100},
  biburl    = {https://dblp.org/rec/conf/irps/ChakrabortySDM20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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