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"µs-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si ..."

Eleonora Canato et al. (2019)

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DOI: 10.1109/IRPS.2019.8720549

access: closed

type: Conference or Workshop Paper

metadata version: 2021-03-02

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  - conf/irps/CanatoMBZMMSBM19
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Eleonora Canato, Fabrizio Masin, Matteo Borga, Enrico Zanoni, Matteo Meneghini, Gaudenzio Meneghesso, Arno Stockman, Abhishek Banerjee, Peter Moens:
µs-Range Evaluation of Threshold Voltage Instabilities of GaN-on-Si HEMTs with p-GaN Gate. IRPS 2019: 1-6

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