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"A straightforward electrical method to determine screening capability of ..."

Judith Berens, Thomas Aichinger (2021)

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DOI: 10.1109/IRPS46558.2021.9405152

access: closed

type: Conference or Workshop Paper

metadata version: 2021-05-05

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Judith Berens, Thomas Aichinger:
A straightforward electrical method to determine screening capability of GOX extrinsics in arbitrary, commercially available SiC MOSFETs. IRPS 2021: 1-5

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