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"Extended TDDB power-law validation for high-voltage applications such as ..."

A. Benoist et al. (2015)

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DOI: 10.1109/IRPS.2015.7112804

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-21

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A. Benoist, S. Denorme, X. Federspiel, Bruno Allard, Philippe Candelier:
Extended TDDB power-law validation for high-voltage applications such as OTP memories in High-k CMOS 28nm FDSOI technology. IRPS 2015: 3

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