"Edge-induced reliability & performance degradation in STT-MRAM: an ..."

Simon Van Beek et al. (2021)

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DOI: 10.1109/IRPS46558.2021.9405209

access: closed

type: Conference or Workshop Paper

metadata version: 2024-10-06

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Simon Van Beek, Siddharth Rao, Shreya Kundu, Woojin Kim, Barry J. O'Sullivan, Stefan Cosemans, Farrukh Yasin, Robert Carpenter, Sebastien Couet, Shamin H. Sharifi, Nico Jossart, Davide Crotti, Gouri Sankar Kar:
Edge-induced reliability & performance degradation in STT-MRAM: an etch engineering solution. IRPS 2021: 1-5

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