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"Sub-nanosecond Reverse Recovery Measurement for ESD Devices."

Alex Ayling, Shudong Huang, Elyse Rosenbaum (2020)

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DOI: 10.1109/IRPS45951.2020.9129596

access: closed

type: Conference or Workshop Paper

metadata version: 2020-07-30

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  - conf/irps/AylingHR20
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Alex Ayling, Shudong Huang, Elyse Rosenbaum:
Sub-nanosecond Reverse Recovery Measurement for ESD Devices. IRPS 2020: 1-8

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