"Reliability and Performance Issues in SiC MOSFETs: Insight Provided by ..."

James P. Ashton et al. (2019)

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DOI: 10.1109/IRPS.2019.8720423

access: closed

type: Conference or Workshop Paper

metadata version: 2022-02-25

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James P. Ashton, Patrick M. Lenahan, Daniel J. Lichtenwalner, Aivars J. Lelis, Mark A. Anders:
Reliability and Performance Issues in SiC MOSFETs: Insight Provided by Spin Dependent Recombination. IRPS 2019: 1-5

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