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"Semi-supervised Defect Segmentation with Uncertainty-aware Pseudo-labels ..."

Dejene M. Sime et al. (2023)

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DOI: 10.1145/3582177.3582190

access: closed

type: Conference or Workshop Paper

metadata version: 2024-05-17

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  dblp key:
  - conf/ipmv/SimeWZ023
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Dejene M. Sime, Guotai Wang, Zhi Zeng, Bei Peng:
Semi-supervised Defect Segmentation with Uncertainty-aware Pseudo-labels from Multi-branch Network. IPMV 2023: 73-78

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