"Temperature- and aging-resistant inverter for robust and reliable time to ..."

Konstantin Tscherkaschin et al. (2016)

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DOI: 10.1109/IOLTS.2016.7604683

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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Konstantin Tscherkaschin, Theodor Hillebrand, Maike Taddiken, Steffen Paul, Dagmar Peters-Drolshagen:
Temperature- and aging-resistant inverter for robust and reliable time to digital circuit designs in a 65nm bulk CMOS process. IOLTS 2016: 121-125

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