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"All Digital Low-Cost Built-in Defect Testing Strategy for Operational ..."

Michael Sekyere, Marampally Saikiran, Degang Chen (2022)

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DOI: 10.1109/IOLTS56730.2022.9897224

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/iolts/SekyereS022
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  - https://dblp.org/rec/conf/iolts/SekyereS022
Michael Sekyere, Marampally Saikiran, Degang Chen:
All Digital Low-Cost Built-in Defect Testing Strategy for Operational Amplifiers with High Coverage. IOLTS 2022: 1-5

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