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"A Test Generation Method Based on k-Cycle Testing for Finite State Machines."

Yuya Kinoshita, Toshinori Hosokawa, Hideo Fujiwara (2019)

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DOI: 10.1109/IOLTS.2019.8854426

access: closed

type: Conference or Workshop Paper

metadata version: 2019-10-07

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  dblp key:
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  - https://dblp.org/rec/conf/iolts/KinoshitaHF19
Yuya Kinoshita, Toshinori Hosokawa, Hideo Fujiwara:
A Test Generation Method Based on k-Cycle Testing for Finite State Machines. IOLTS 2019: 232-235

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