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"Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor."

Swaroop Ghosh et al. (2006)

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DOI: 10.1109/IOLTS.2006.19

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  dblp key:
  - conf/iolts/GhoshBRR06
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  persistent URL:
  - https://dblp.org/rec/conf/iolts/GhoshBRR06
Swaroop Ghosh, Swarup Bhunia, Arijit Raychowdhury, Kaushik Roy:
Delay Fault Localization in Test-Per-Scan BIST Using Built-In Delay Sensor. IOLTS 2006: 31-36

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