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"Robustness of circuits under delay-induced faults : test of AES with the ..."

Olivier Faurax et al. (2007)

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DOI: 10.1109/IOLTS.2007.57

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

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  - https://dblp.org/rec/conf/iolts/FauraxTFB07
Olivier Faurax, Assia Tria, Laurent Freund, Frédéric Bancel:
Robustness of circuits under delay-induced faults : test of AES with the PAFI tool. IOLTS 2007: 185-186

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