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"CMOS Characterization and Compact Modelling for Circuit Reliability ..."

Javier Diaz-Fortuny et al. (2018)

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DOI: 10.1109/IOLTS.2018.8474244

access: closed

type: Conference or Workshop Paper

metadata version: 2023-09-30

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  dblp key:
  - conf/iolts/Diaz-FortunyMRN18
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  - https://dblp.org/rec/conf/iolts/Diaz-FortunyMRN18
Javier Diaz-Fortuny, Javier Martín-Martínez, Rosana Rodríguez, Montserrat Nafría, Rafael Castro-López, Elisenda Roca, Francisco V. Fernández:
CMOS Characterization and Compact Modelling for Circuit Reliability Simulation. IOLTS 2018: 139-142

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