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"A smart test controller for scan chains in secure circuits."

Jean DaRolt et al. (2013)

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DOI: 10.1109/IOLTS.2013.6604085

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-22

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  - conf/iolts/DaRoltNFR13
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Jean DaRolt, Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre:
A smart test controller for scan chains in secure circuits. IOLTS 2013: 228-229

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