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"A software-based self-test strategy for on-line testing of the scan chain ..."

Oscar Ballan et al. (2013)

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DOI: 10.1109/IOLTS.2013.6604055

access: closed

type: Conference or Workshop Paper

metadata version: 2021-07-25

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Oscar Ballan, Paolo Bernardi, B. Yazdani, Ernesto Sánchez:
A software-based self-test strategy for on-line testing of the scan chain circuitries in embedded microprocessors. IOLTS 2013: 79-84

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